Table 1 Statistical parameters of the non-defective sample
From: Interfacial assessment of degraded amorphous silicon module using scanning probe microscopy
Horizontal distance (μm) | Vertical distance (nm) | Surface distance (μm) | Rmax Ra (nm) | RMS Rq (nm) | Ave. height (Ra)(nm) | Radius (μm) | Radius sigma (μm) |
|---|---|---|---|---|---|---|---|
0.116 | 1.189 | 0.317 | 8. 63 | 1.227 | 9.17 | 4.035 | 0.001 |
0.120 | 3.917 | 0.421 | 7.29 | 0.447 | 8.511 | 7.098 | 0.685 |
0.116 | 7.016 | 0.3 17 | 7.16 | 1.238 | 4.890 | 5.933 | 0.825 |