Table 2 PFQNM measured spectral parameters observed during measurements
From: Interfacial assessment of degraded amorphous silicon module using scanning probe microscopy
Sample | Spectral period (μm) | Spectral frequency (μm) | Temporal frequency(Hz) | Spectral RMS amplitude (nm) |
|---|---|---|---|---|
Non-defective | 1.05 | 0.957 | 25.9 | 2.56 |
Defective | 0.331 | 3.35 | 2.80 | 0.0825 |