Table 4 Statistical analysis for the blister defective cluster
From: Interfacial assessment of degraded amorphous silicon module using scanning probe microscopy
Horizontal distance (μm) | Vertical distance (nm) | Surface distance (μm) | Rmax Ra (nm) | RMS Rq (nm) | Average height (Ra)(nm) | Radius (nm) | Radius sigma (nm) |
|---|---|---|---|---|---|---|---|
0.265 | 12.731 | 0.265 | 9.971 | 9.683 | 9.880 | 3.625 | 0.136 |
0.221 | 10.613 | 0.221 | 11.515 | 7.322 | 7.296 | 3.878 | 0.102 |
0.258 | 10.494 | 0.258 | 10.173 | 9.244 | 10.035 | 3.435 | 0.137 |