Table 3 Statistical analysis of the defective sample
From: Interfacial assessment of degraded amorphous silicon module using scanning probe microscopy
Horizontal distance (μm) | Vertical distance (nm) | Surface distance (μm) | Rmax Ra (nm) | RMS Rq (nm) | Average height (Ra)(nm) | Radius (nm) | Radius sigma (nm) |
|---|---|---|---|---|---|---|---|
0.516 | 9.022 | 0.517 | 19.184 | 4.843 | 2.910 | 9.417 | 0.227 |
0.516 | 10.790 | 0.517 | 17.212 | 2.939 | 3.939 | 3.310 | 0.003 |
0.520 | 6.753 | 0.521 | 7.778 | 2.098 | 2.580 | 6.765 | 0.471 |